Advanced System Engineering Lab

The HF lab specializes in measuring planar, “on-wafer” test samples at up to 110 GHz and the 3D characterization of antenna modules in shielding cabins. We can also determine the dielectric parameters of substrates nondestructively.

• 2-gate 110GHz network analyzer
• 4-gate 65GHz network analyzer
• Chuck for on-wafer probing (thermal control up to 200°C)
• 18 GHz shielding cabin
• Antenna measurement station for 3D far-field measurements
• Calibrated horn antennae up to 110GHz
• Impedance analysis
• HF and DC measurement tips for planar test samples
• Signal analyzers / generators
• Split cylinder resonators for material characterization
• Measurement station for thin film threshold voltages

• Ansys (in particular Icepack, HFSS, Maxwell, Q3D, SI-Wave)
• Mathematica, Matlab
• CST Microwave Studio
• Cadence design environment
• Agilent ADS
• Measurement device control using Wincal and Labview