Manufacturing & Prototyping

The telescope optic Top 200 distributed by Instrument Systems in combination with a spectrometer allows the precise measurement of radiance, brightness and chromaticity coordinate of displays, as well as back lighted symbols of LEDs and other sources such as OLEDs.

A 2-axis system permits automated measurements of brightness distribution and location-dependent spectrum e.g., displays up to 24” in a diagonal configuration or in A3-format area.

Our system also has the ability to measure the spatially resolved/location-dependent spectra of filters, films, LCTF/LCD (liquid crystal filters) and other flat substrates.

The polarization of these light sources can also be measured by using a polarizing filter on the Top 200.

Features:

Fixed focal plane 60 mm; F/2.8;  370 nm – 800 nm

Photosensitivity: 1.5 – 100.000 cd/m²

Field of view: 4 mm x 7 mm up to 60 mm x 90 mm

Resolution (spot size): 0.16 mm – 3.8 mm up to 2 mm – 47 mm (can be extended)

Displacement of the x- and y-axis: x:300mm y:250mm

Resolution of the x- and y-axis: 50 microns