Trainings and Workshops

Welcome to our joint workshop with Keysight. By providing presentations and practical demonstrations on the fundamentals of spectrum and signal analysis, vector signal generation and network analysis, Keysight want to give you an insight into the theory and practice of modern measurement technology.

As part of our lab tour, Fraunhofer IZM will also present advanced methods for the characterization of high-frequency materials and components, antenna evaluation, millimetre-wave front-end modules and the functional evaluation and calibration of radar and communication modules. Let's discover the fascinating technologies and their applications together.

Basics of spectrum and signal analysis

Using practical demonstrations, we explain what is important in spectrum analysis, how to reduce the noise floor and thus measure much more sensitively. We also cover the most important components required for a spectrum analyzer and explain how they interact. We also calculate the possible measurement accuracy.

Basics of vector signal generation

Here we look at the basic concept of a vectorial generator and the principles of digital modulation. We explain which components must interact (baseband generator, output stage, ALC, etc.) to enable a clean modulated signal and demonstrate this using practical examples (e.g. WLAN, Bluetooth or 5G).

Basics of network analysis

In this presentation we will cover the following topics:

• What measurements does a network analyzer make?
• What are the most important components of the devices?
• What are S-parameters?
• How and why do you calibrate a network analyzer?

The topic is rounded off with practical measurement examples to illustrate the content.

Lab tour topics

RF material and components characterization
In the laboratory for material and components characterization, we show different measurement methods, e.g. Fabry-Perot resonators and Free-Space quasi-optical bench to characterize high-frequency dielectrics up to terahertz frequencies.

Antenna evaluation and characterization
In the Antenna absorber chamber with a robot to measure the spherical radiation pattern diagram of passive antennas up to 325 GHz.

RF characterization of mm-wave frontend modules

Characterization of active components / modules with coaxial and waveguide outputs as well as on wafer probing level up to 325 GHz.

Example measurements are: Broadband sensitivity analysis, performance analysis of TX and/or RX modules on wafer or PCB.

Functional evaluation and calibration of radar and communication modules
Characterization and evaluation of active modules up to 325 GHz

Corner reflectors and standardized targets for evaluation of radar modules (angle separation capability, depth separation capability, ...)

Line of Side Measurement / Non-Line of Side Measurement of Communication modules