In recognition of the significant quality of his research work on discontinuities, Ivan Ndip (Ph.D. Student & Research Engineer at Fraunhofer IZM) received a Silver Leaf Certificate Award at the IEEE conference on Ph.D. Research in Microelectronics and Electronics (PRIME 2006) in Otranto (Lecce), Italy.

The outstanding paper presented by Ivan Ndip at PRIME 2006 entitled, “A Novel Methodology for Defining the Boundaries of Geometrical Discontinuities in Electronic Packages” is based on his doctoral dissertation, supervised by Prof. Dr.-Ing. Dr.-Ing. E.h. H. Reichl.

The aim of the PRIME conference is to provide an opportunity for Ph. D. students from all over the world to present their research activities and contact other people in the research community. It is sponsored by the IEEE Circuits and Systems Society (CAS). PRIME 2006 took place from June 11-15, 2006.