Process demonstration of 300 mm die stacking (D2W FC Bonding) - Die per wafer: 120 - Die size: 20.4 x 20.4 mm - SnAg-cap on Cu-pillar - Bump pitch: 55µm - Bump height: 25µm - Bump diameter: 25µm - Bump per die: 143.616 - Bump per wafer: 20.967.936